BSE-3000 System Level Test Handler for High-Power and Complex ICs
“The BSE-3000 SLT handler ensures your devices are proven in real-world conditions, delivering reliable performance validation before they reach your customers.”
BSE-3000 Series
“The BSE-3000 SLT handler ensures your devices are proven in real-world conditions, delivering reliable performance validation before they reach your customers.”
System level test (SLT) equipment is becoming increasingly dominant as ICs grow more complex, heterogeneous and software-dependent. Shrinking time-to-market windows and the rising cost of high-end ICs make SLT equipment one of the most important pieces of equipment on the test floor.
The BSE-3000 Series SLT handler can be configured with six to 16 asynchronous test sites for ambient-hot and tri-temp testing, with space for test boards up to 680x500mm. Each test site can be configured with up to 180Kg contact force and our Active Thermal Control unit for high-wattage ICs. The BSE-3000 Series can support up to 2,500 units per hour and allows the user to select different run modes to prioritize total throughput or a more balanced test site utilization. Four automated output bins are standard; however, users can also opt for the “multi-bin” module, which provides 15 fixed trays.
Device Pin 1 orientation, 2D read and optical character recognition can be performed simultaneously with a single camera upgrade. At the same time, other users may opt for bottom-side automated optical inspection to check solder ball integrity.
- Dual and Tri-Temp Configurations
- 4x4mm Up to 100x100mm Devices
- Up to 2,500 Units Per Hour
- Up to 180Kg Contact Force Per Site
- Automated Optical Inspection
